• Reliability of large periphery GaN-on-Si HFETs, S. Singhal, T. Li, A. Chaudhari, A.W. Hanson, R. Therrien, J.W. Johnson, W. Nagy, J. Marquart, P. Rajagopal, J.C. Roberts, E.L. Piner, I.C. Kizilyalli and K.J. Linthicum (2006), Paper published in Microelectronics Reliability, Volume 46, Issue 8, August , pp. 1247-1253.
• GaN-on-Si Failure Mechanisms and Reliability Improvements. Singhal, S., Roberts, J.C., Rajagopal, P., Li, T., Hanson, A.W., Therrien, R., Johnson, J.W., Kizilyalli, I.C., & Linthicum, K.J. (2006). Paper presented at the 2006 IEEE International Reliability Physics Symposium (IRPS), San Jose, CA. Accompanying PowerPoint Presentation.
• Reliability of Large Periphery GaN-on-Si HFETs. Singhal, S., Li, T., Chaudhari, A., Hanson, A.W., Therrien, R., Johnoson, J.W., Nagy, W., Marquart, J., Rajagopal, P., Piner, E.L., & Linthicum, K.J. (2005). Paper presented at Reliability of Compound Semiconductors Workshop 2005, Palm Springs, CA.
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